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Postdoc in Analysis of Novel Quantum Materials with Electron Microscopy Techniques
Harvard University in Cambridge, Massachusetts
Date Posted 07/01/2021
Admin-Other Administrative Positions
Employment Type FullTime
Application Deadline Open until filled

We seek a postdoctoral fellow position in our group as part of the Harvard Quantum Initiative (HQI) and the Center for Integrated Quantum Materials (CIQM) in the area of Transmission and Scanning Transmission Electron Microscopy (S/TEM) of novel quantum materials. We seek to visualize and understand quantum phases of matter at the atomic scale sensing using TEM/STEM coupled to analytical methods Electron Holography, EDS and EELS as well as possible in situ manipulation. We aim to correlate atomic-scale insights with macroscopic properties and also induce novel phenomena in quantum materials. We plan to investigate a variety of material platforms, from layered 2D heterostructures to bulk crystals to atomically engineered oxides and more.

Initially for one year but this position is renewable if the candidate is successful.

How to Apply

Apply Online:

To apply, please upload the following; • a cover letter describing your past research experience and future projects you may have interest in (2 pages max). • a full academic CV • names and email addresses of 3 references. Letters of reference should be addressed to Professor David Bell and referees should submit using url provided (and not via email). SEAS is dedicated to building a diverse and welcoming community, and we strongly encourage applications from historically underrepresented groups.

Applicants with (1) a background in high-resolution scanning transmission electron microscopy, (2) experience in the analysis of microscopy/spectroscopy data for uncovering subtle phenomena, (3) experience or strong interest in 4D-STEM techniques and (4) have an interest in developing a methodology for in-situ methods to help elucidate the
behavior and properties of novel quantum materials are welcome to apply. For the electron microscopy experiments, our group will use aberration corrected electron microscopes (JEOL ARM 200F, Hitachi HF-3300(S), aberration corrected LEEM, focused ion beams and other analytical tools located at the Center for Nanoscale Systems.


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